Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for ... / Materials Physics and Applications)

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for ... / Materials Physics and Applications)

By Seiler, David G. (EDT), Diebold, Alain C. (EDT), McDonald, Robert (EDT), Garner, C. Michael (EDT), and Herr, Dan (EDT)

Books / Hardcover

Books › Science › Physics › General

Books › Technology & Engineering › Industrial Engineering

ISBN: 0735404410 / Publisher: American Institute of Physics, September 2007

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This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development. Read More
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Brand New! With CD! Shrink wrapped! A brand new, unused and unread copy in perfect condition. NOT AVAILABLE FOR SHIPMENT OUTSIDE OF THE UNITED STATES.

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