Measurement of Intelligence: An Explanation of and a Complete Guide for the Use of the Stanford Revision and Extension of the Binet-Simon Intelligence Scale By Terman, Lewis M. Books / Hardcover Books Publisher: Houghton Mifflin Company, January 1916 Price Starting at $4.99 Free Shipping Send to a friend Add to Wishlist Below is a list of products arranged by condition. Select the quantity of the product you desire and click the "Add" button. Used - Acceptable Acceptable condition. No Dust Jacket. Stamped on inside. Endpage missing. $4.99 1 in Stock at Warehouse Quantity Add Free Shipping to continental U.S. OR $1.00 per item discount if shipped to store. Reviews Goodreads reviews for Measurement of Intelligence: An Explanation of and a Complete Guide for the Use of the Stanford Revision and Extension of the Binet-Simon Intelligence Scale There are not any review yet for this book